RF Design Magazine


Test & Measurement
May 1, 2007 12:00 PM 

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Digital spectrum analyzers

The Aeroflex 3280 series spectrum analyzers offer digital demodulation for the analysis of 802.11a, b and g wireless networks. Digital demodulation in the 3280 series is operated in one of two modes. Full-frequency mode links the rear panel IF-output at 421.4 MHz to the demodulator input, allowing the user to demodulate signals over the full frequency range of the spectrum analyzer (3 GHz, 13.2 GHz or 26.5 GHz).

Dual-channel mode links directly from the instrument's front panel or optionally via a rear panel connector to create a dual-channel instrument. The frequency range for the direct input of the demodulator is 300 MHz to 3 GHz. Although the 3280 series' digital demodulation hardware option does not include direct I and Q outputs, users who require it can access a direct digital I and Q output in streaming serial format by adding the optional low-voltage data signal (LVDS) output cable. The 3280 is priced at approximately $23,000.
Aeroflex
(800) 835-2352

www.aeroflex.com

Amplified noise source

NoiseWave's NW3G-M amplified noise module features broadband frequency coverage from 10 MHz to 3 GHz for test applications. NoiseWave offers users a broad bandwidth while meeting the highest standards for todays' tests. The NW3G-M features output power of 0 dBm and spectral flatness of ±2.0 dB. Internal regulation is standard and the unit operates with +15 Vdc typically drawing 120 mA. The unit comes standard with SMA connectors and is in a housing of 4 in. × 1 in. × 0.5 in. Alternative voltages, output levels and frequencies are also available. Applications include built-in test equipment, dithering for increased dynamic range of ADCs, simulation of broadband signals and as an economical source for bit-error-rate (BER) and SNR testing.
Noisewave
(973) 386-1119

www.noisewave.com

X-ray inspection system

The Medalist x6000 AXI from Agilent Technologies is an in-line 3-D x-ray inspection system that detects printed circuit board assembly (PCBA) solder and manufacturing assembly defects. The system reduces customers' manufacturing conversion costs without compromising defect-detection capability. Double-sided PC boards benefit from 3-D inspection because users can discriminate between the top and bottom sides of boards where there is a high-density of solder joints.

Typical communication and computation products can have 35% overlap or more between the solder joints, which severely compromises the test-coverage effectiveness of in-line 2-D solutions for these products. However, 3-D coverage can be used to effectively inspect the entire board. The Agilent Medalist x6000 x-ray inspection system ships this month.
Agilent Technologies
(408) 345-8886

www.agilent.com

IC test system

ProductionLine Testers' PLT1000 is designed to test low- to medium-complexity wafers or packaged IC's at 1000 tests per second. The general-purpose IC test system is a PC-sized benchtop test system small enough to sit on top of or under most device handlers and probers. The system is programmed through an Excel-like spreadsheet where each row defines a test and each column defines a test pin. Double-clicking a test brings up a second screen for setting the test conditions associated with that row.

Applications include high-speed testing of analog, digital, and optical devices, including optocouplers, power management ICs, regulators, clock chips and transceivers. Users customize their systems by choosing among a variety of boards, including digital I/O, power sources, a pico-ammeter, time interval analyzer, quad clock and frequency counter. A prober/handler interface board also sits in the test head. Most internal calculations are pre-compiled before actually testing, and many setups and housekeeping tasks are done during the prober/handler cycle time. Pricing begins at $60,000.
ProductionLine Testers
(925) 931-1255

www.productionlinetesters.com

Microwave spectrum analyzer

Anritsu's MS271xB family of economy microwave spectrum analyzers covers the 9 kHz to 7.1 GHz, 13 GHz, and 20 GHz frequency ranges. The MS271xB family is a cost-effective alternative for bench testing of microwave components, subsystems, and systems. These analyzers have 1 Hz to 3 MHz RBW, amplitude accuracy better than ±1.3 dB, and low phase noise of -114 dBc/Hz at 10 kHz offset. Dynamic range is typically 100 dB. Features include rms detection and channel power ratio measurements, as well as AM/FM demodulation, limit testing, and extensive marker functions, including counted markers and marker noise measurements. All three models offer optional WCDMA/HSDPA RF measurements, and optional IQ demodulation hardware to support WCDMA demodulation. The 9 kHz to 7.1 GHz MS2717B is priced at $12,950. The 9 kHz to 13 GHz MS2718B is priced at $16,950, and the 9 kHz to 20 GHz MS2719B is priced at $19,950.
Anritsu
(800) 800-8312

www.us.anritsu.com

Battery-powered DSO

Battery-powered versions are available for all 16 of Agilent's 6000 series digital storage oscilloscopes (DSOs) and mixed-signal oscilloscopes (MSOs). Agilent is the first to offer battery-powered DSOs with up to 1 GHz bandwidth. Testing applications include automotive serial buses, such as CAN, LIN and FlexRay. Agilent's integrated rechargeable battery options are based on Li-ion technology, and they provide more than two hours of battery life between charges. The battery charges while plugged into line power and can be disconnected at any time without powering off the oscilloscope. In addition, Agilent offers an adapter cable to power oscilloscopes from 12 V automotive outlets. The 6000 series models with the rechargeable battery option are available in the following prices and bandwidths: $6,200 for 100 MHz; $8,240 for 300 MHz; $10,100 for 500 MHz; and 1 GHz for $12,850. The N5424A 12 V automotive adapter cable is $150.
Agilent Technologies
(408) 345-8886

www.agilent.com

Coplanar attenuator

State of the Art's (SOTA) wire bondable or solderable “0303” (0.030 in. × 0.030 in. × 0.010 in.) coplaner balanced-T attenuators are available on alumina or aluminum nitride (high-power) substrates. Constructed using a high-stability thin-film resistor element, these devices are available with attenuation values from 1 dB to 20 dB for high-frequency applications up to 20 GHz. Attenuation tolerance is less than ±0.5 dB to 12 GHz and ±1 dB to 20 GHz. VSWR is less than 1.4:1 up to 20 GHz. Performance data is available on chip and mounted on Rogers 4350 boards. Wire-bondable versions have gold terminations. Solderable versions have 60/40 SnPb over a nickel barrier. Pricing for the attenuators is under $1.90 in production quantities.
State of the Art
(800) 458-3401

www.resistor.com

CRTU protocol testers

Rohde & Schwarz's three major enhancements to its CRTU series of wireless protocol testers are an interoperability test suite, multimedia broadcast multicast service (MBMS) measurement capability, and support for unlicensed mobile access (UMA) technology. The interoperability tool suite allows network operators and mobile phone manufacturers to quickly perform interoperability and application tests in the laboratory in order to ensure that equipment will function properly in service. An MBMS test scenario for the R&S CRTU-W protocol tester expands the UMTS mobile radio standard that makes it possible to transfer multimedia data such as mobile TV or MMS to many users simultaneously, reducing network load. UMA technology, developed under the auspices of the UMA Alliance, enables mobile phones to function in WLANs as well as their native wireless networks. All of the enhancements to the CRTU instruments are available.
Rohde & Schwarz
(503) 403 4700

www.rsa.rohde-schwarz.com

Compact scopemeter

The compact ScopeMeter 120 series from Fluke is an integrated test tool, with an oscilloscope, multimeter and “paperless” recorder in one instrument. The series is comprised of the Fluke 125, Fluke 124 and Fluke 123. The oscilloscope bandwidth for the 125 and 124 is 40 MHz; the bandwidth for the 123 is 20 MHz. All units feature an input range from 5 mV to 500 V, and have dual true rms inputs. Each unit is also capable of measuring the following: Vdc, Vac, Vac + Vdc, resistance, continuity, diode-test, current, temperature (°C or °F), capacitance, dBV, dBm, crest factor, touch hold and zeroset. The units are also capable of capturing glitches as small as 40 ns. The ScopeMeter 125 also features a bus health test for industrial bus systems and has power measurement capabilities.
Fluke
(425) 347-6100

www.fluke.com

UMTS LTE test instruments

By using the option SMU-K55, the SMU200A from Rohde & Schwarz can generate LTE downlink and uplink signals, and allow the user to vary reference signals, control and synchronization channels, and define data sources. It employs an easy-to-use resource allocation scheme. To analyze transmitted LTE downlink and uplink signals, the FSQ is complemented by the FSQ-K100 (LTE downlink) and FSQ-K101 (LTE uplink) software options. The options permit evaluation of modulation quality, spectrum CCDF measurements, EVM measurement vs. subcarrier and symbol, and provide a constellation diagram and graphical presentation of measurement results. Both options are available.
Rohde & Schwarz
(503) 403-4700

www.rsa.rohde-schwarz.com

Integrated test system

Keithley's automated characterization suite (ACS) is an integrated test system for semiconductor characterization at the device, wafer and cassette level. These systems incorporate a variety of test hardware and overall unique measurement capability. The model 4200-SCS semiconductor characterization system features I-V source measure and specialized pulse testing packages, such as the model 4200-PIV package for testing of advanced semiconductor materials.

The series 2600 SourceMeter instruments feature TSP-link and test script processor for scalable I-V channel count systems, fast parallel measurements, and complex test sequences for applications such as on-the-fly NBTI or on-wafer component characterization. The series 2400 SourceMeter instruments feature high-voltage and high-current sourcing. Optional switching, C-meters, and pulse generators round out the instrument capabilities of ACS integrated test systems. The test systems are available.
Keithley Instruments
(440) 248-0400

www.keithley.com

RF benchmarking tool

Tektronix has enhanced its RF Scout Interference Hunter applications to include an RF benchmarking capability, enabling competitive measurements of carrier network quality and coverage. The enhanced tool also includes integrated map-based spectrum analysis for faster and more effective network optimization. The RF Scout provides RF signal analysis tools necessary to support an effective approach to network optimization activities, from hunting for radio frequency interference to checking indoor and outdoor signal quality and coverage, in one handheld tool. The new RF benchmarking capability enables field engineers and technicians to make multiple measurements at multiple frequencies in one physical pass. For example, the RF Scout can scan GSM and WCDMA signals as well as make noise floor measurements. Multiple carrier signals also can be captured and analyzed with different measurements taken for each signal.
Tektronix
(800) 835-9433

www.tektronix.com

Converged handset tester

Azimuth Systems' FMC performance test solution includes a comprehensive suite of automated test scripts that streamline the testing of fixed-mobile convergence products by service providers, handset manufacturers and semiconductor vendors. More than 20 unique and repeatable performance tests on converged Wi-Fi/cellular handsets are provided over a range of real-world environment dynamics. The test solution measures Wi-Fi performance in three areas that get the most attention from end-users: dropped calls, battery life and call quality. The tests allow users to analyze the voice quality and data performance of converged Wi-Fi/cellular handsets in a variety of range, roaming, hand-in/hand-out and environmental conditions. The tests also measure handset power consumption and battery life under various motion and traffic conditions. The automated scripts remotely control the device under test, generate/display statistics and reduce the testing process from weeks to days. The basic software suite runs on Azimuth's W-series test platform.
Azimuth Systems
(978) 263-6610

www.azimuthsystems.com

Mixed-signal oscilloscopes

LeCroy Corporation has released high-performance mixed-signal oscilloscopes for the WaveRunner Xi and WaveSurfer Xs series. With analog bandwidths up to 2 GHz, a maximum digital input frequency of 500 MHz, and long memory of 50 Mpts/ch, the mixed-signal oscilloscopes deliver raw performance and solutions for serial data buses such as I2C, SPI, UART, RS-232, CAN and LIN. They provide up to 36 digital channels. Available in two models, the MS series high-performance mixed-signal oscilloscopes add tools for the design and debug of embedded systems to the WaveRunner Xi and WaveSurfer Xs. The MS-500 has a maximum input frequency of 500 MHz, which is suitable for faster-speed embedded systems and the 50 Mpts/ch memory allows long capture of up to 25 ms of digital data at full sample rate, simultaneously, on each of the 18 channels. The mixed-signal oscilloscope can be operated in a 36-channel mode. This ensures that every important analog and digital signal can be measured. The MS-250 provides the capture of 10 ms of digital data, with speeds up to 250 MHz, on 18 channels.

The WaveRunner Xi and WaveSurfer Xs leverage the streamlined LeCroy user interface and simplify how mixed-signal oscilloscopes operate. The 10.4-inch color intuitive touch-screen graphical user interface and front panel make it easy to view analog and digital channels simultaneously, and eliminate the learning curve associated with logic analyzers.

The number of digital channels time aligned and synchronized to the oscilloscope channels in embedded system measurements create a need for powerful and flexible triggering. The WaveRunner Xi and WaveSurfer Xs mixed-signal oscilloscopes provide the triggering necessary to guarantee that important events can be captured and isolated.
LeCroy Corp.
(800) 553-2769

www.lecroy.com

Synthesized signal generator

To provide an alternative for test scenarios in which only a high-quality CW source is required, dBm Corp. has introduced the SSG synthesized CW signal generator. This instrument focuses on simplicity, connectivity, and excellent RF performance in a small and low-cost solution. The SSG can be held with one hand, yet it has enough mass to stay planted on the workbench with heavy coax cables attached to it. Front-panel control of the frequency and amplitude is achieved with a combination of buttons and a rotary knob.

Step size is determined by positioning the cursor at the desired digit and turning the knob, or an arbitrary step size can be set independently for the frequency and amplitude.

It offers a frequency range of 10 MHz to 4000 MHz with a resolution of 10 Hz up to 1999.99999 MHz and 20 Hz for 2000 MHz to 4000 MHz. With internal or external reference, the frequency accuracy is ±2 ppm. Frequency update rate is 2 ms via LAN or GPIB. Typical standard settling time is 2 ms, while at band crossings (1 GHz, 2 GHz) it is <12 ms. Phase noise at 1 GHz is -58 dBc with 10 Hz offset and -81 dBc with 100 Hz. Noise floor is given as <-145 dBm/Hz. Output power range is from +10 dBm to -30 dBm. Impedance is 50 Ω.

The SSG can function within an automated test system, since it can be remotely controlled via IEEE-488.2, RS-232, and 10/100BaseT Ethernet interfaces.
dBm Corp.
(973) 709-0020

www.dbmcorp.com

High-power pulsed source

H6 Systems' model MPS-5KW is a microwave pulse source with a frequency range of 220 MHz to 5000 MHz and ±2% accuracy. It offers direct readout of peak power, pulse width, PRF, frequency overload protected, sync in/sync out capability, and external pulse input capability. Plus, it allows continuous adjustment of peak output power, pulse width, and repetition rate.

Front-panel connectors permit synchronizing from an external trigger source as well as synchronizing external equipment with the internal generated trigger pulse. A pulse from an external generator may be used in which case, the pulse-forming circuit is disabled. Automatic overload protection and time delay and sequencing circuits are provided. A front-panel peak reading power meter is provided for monitoring RF output power at duty cycles greater than 0.0005.

There are 13 units in this family. While model 2250 (220 MHz to 450 MHz) provides an output power of 5 kW, model 44010's (4400 MHz to 5000 MHz) output power is 1 kW.
H6 Systems
(603) 880-2250

www.h6systems.com

Manufacturing test software

LitePoint Corp. is offering IQfact manufacturing test software for WiMAX products based on Wavesat chipsets. This software runs on IQmax-500 R&D and IQmax-100 WiMAX manufacturing one-box test solutions.

The IQfact for Wavesat software integrates into the LitePoint IQmax API, allowing turnkey testing of Wavesat-based products for R&D and manufacturing applications. The first IQfact release for Wavesat is optimized for products based on the Wavesat Evolutive DM256 fixed WiMAX chipset and will be extended to support other Wavesat fixed and mobile chipsets. IQfact runs on LitePoint IQmax-500 R&D and IQmax-100 high-volume manufacturing WiMAX one-box test solutions. The software contains an operator interface, a test suite of recommended tests and test limits, and calibration and verification procedures for manufacturing WiMAX products. IQfact for Wavesat offers an out-of-the-box WiMAX solution that allows for quick bring-up and integration into a factory's manufacturing environment.

The IQmax-500 R&D and IQmax-100 manufacturing test products are wide bandwidth devices. LitePoint one-box testers independently produce highly accurate signals ensuring consistent and reliable test results.
LitePoint Corporation
(408) 456-5000

www.litepoint.com



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