The Global Semiconductor Alliance (GSA) has announced the release of its Analog/Mixed-Signal/Radio Frequency (AMS/RF) Process Checklist Version 1.0. It is an aid for users of AMS/RF foundry services and provides standard definitions for quality and quantitative metrics. Developed by the GSA MS/RF Subcommittee’s Process Control Monitoring (PCM)/Process Checklist Working Group, the AMS/RF Process Checklist's metrics can be used for classification as well as for figures of merit in selecting the right semiconductor process for a specific design or application. Among the items covered by the checklist are process type, process attributes, active device attributes, and passive device attributes, and device libraries.

According to David Schwan, engineering manager at RF Micro Devices and committee chairman for GSA’s PCM/Process Checklist Working Group, "The Process Checklist provides a quick and consistent overview of a mixed-signal process. Prior to the checklist’s availability, finding the equivalent information would often mean searching a number of documents. This checklist makes it easier for key decision makers to quickly determine whether a particular process has all of the required features." Targeted users of the checklist include semiconductor companies and contractors.

www.gsaglobal.org