Probe System Supports RF/Microwave Testing Dec 16, 2008 6:10 PM
Probe manufacturer SemiProbe has created a low-cost, multifunction probe system suitable for university and industrial research applications requiring simple, stable probe solutions. The model LA-150 is available in both DC and RF/microwave configurations which allow individual manipulator or probe-card contact to a device under test (DUT). The standard configuration is equipped with two DC manipulators, a trinocular stereo zoom microscope, a 150-mm vacuum chuck, and a platen that provides 360 deg. of manipulator placement. Manipulators are magnetic based and are supplied with coaxial probe arms and a clamping Colette to securely hold the probe needle. The microscope is mounted on a boom pole mount allowing the scope to be swung away from the probing area during setup. The large platen has a removable front panel to allow for easy load/unload while still providing full front manipulator positioning capability. A standard 4.5-in. probe-card holder is built into the platen. The 60-lb. system can be installed in less than an hour.
