Memory effect was checked on the single-building block HBT by varying the two-tone frequency spacing from 1 MHz to 120 MHz. Figure 3 demonstrates the test results for average power levels from 10 dBm to 30 dBm.

The test was done from 1 MHz to 120 MHz. The curves are from 10 dBm to 30 dBm of the average power (PEP is 3 dB higher). The IMD3 is fairly flat across this frequency band.

Figure 4 compares the 1BB power HBT (with P_sat ~ 33 dBm) tested under two-tone and WCDMA signals at 2.14 GHz with and without the dynamic bias circuit in the near- class B bias condition. The improvement in linearity by the dynamic bias circuit is most noticeable over the output power range within 15 dB of the P1dB. At 20 dBm average P_out, the ACLR of WCDMA signal improves over 10 dB. The IM3 improves by 15 dB at 23 dBm output power. At high power levels where the peak power exceeds P_sat, the clipping of current or voltage waveforms becomes the dominant non-linear effect and cannot be improved by the dynamic bias circuit.

Temperature response of the dynamic bias circuitry: The RF performance of the 28 V HBT with dynamic bias circuit scales well with the sizes up to four building blocks (or ~38 dBm saturated power). The dynamic bias circuit also demonstrates excellent temperature stability in RF operation as evaluated over the -40 °C to +85 °C range. A 2BB size HBT with the dynamic bias circuit was evaluated over temperature with its result shown in Figure 5. At ACLR = -50 dBc under the WCDMA signal, the output power is maintained within 1 dB; the efficiency at ACLR = -50 dBc is 16% over the same temperature range.

The power HBT with dynamic bias circuit also performs well on other modulation schemes.

Several rounds of accelerated lifetime tests were conducted. At 28 V bias and 0.05 mA/µm² quiescent bias current, 3000 hour tests were repeated at a junction temperature of 310 °C. This level of lifetime is expected as the 28 V HBT operates at lower current density than its 5 V counterpart since the current density is one key factor to the lifetime. The collector sidewall in the 28 V HBT has not shown any leakage in the accelerated lifetime test. These tests demonstrate that 28 V HBT not only maintains the same level of lifetime as the 5 V InGaP/GaAs HBT^[12], but also is rugged against mismatch, RF power overdrive, and V_CC fluctuations.

The result is shown in Figure 6.

A Gummel plot was taken before and after the 3000 hours accelerated life test. Figure 6 presents the outcome. Little change can be noticed down to the nA range.

The power device, under normal usage, may be subjected to mismatch or overdrive conditions and it must be rugged enough to survive such conditions. The ruggedness is related to the level of ballasting. Under the presently chosen ballasting level, the three HBTs of 1BB, 2BB and 4BB were individually tested for output mismatch. The input power is held constant at the level providing output power of P_1dB under normal operation; then the output load is changed from 50 Ω to 10:1 under all phases. The test started at V_CC = 24 V and went all the way up to 30 V without any observed device degradation.

With the peak-to-average ratio (PAR) of the modulation signal in the 6 dB to 10 dB range, it is not uncommon to have the peak power level overdrive the amplifier way beyond the 1 dB gain compression point. Therefore, another test was conducted with the RF overdrive under the normal matching condition with the collector biased at 28 V. For all three sizes, 8 dB gain compression at 2.14 GHz was achieved without damage or degradation with the sine wave CW signal.

A small number of samples also underwent an RF burn-in. The HBT hybrid amplifier was driven to P1dB level at room temperature for more than 500 hours, and no change can be noticed. All these experiments demonstrate that a InGaP/GaAs HBT can be a rugged, reliable, and linear device for industrial applications such as a base station amplifiers.

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